BibTeX record conf/itc/JafarzadehKRNAH23

download as .bib file

@inproceedings{DBLP:conf/itc/JafarzadehKRNAH23,
  author       = {Hanieh Jafarzadeh and
                  Florian Klemme and
                  Jan Dennis Reimer and
                  Zahra Paria Najafi{-}Haghi and
                  Hussam Amrouch and
                  Sybille Hellebrand and
                  Hans{-}Joachim Wunderlich},
  title        = {Robust Pattern Generation for Small Delay Faults Under Process Variations},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
                  October 7-15, 2023},
  pages        = {111--116},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ITC51656.2023.00026},
  doi          = {10.1109/ITC51656.2023.00026},
  timestamp    = {Tue, 09 Jan 2024 17:09:36 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/JafarzadehKRNAH23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.