BibTeX record conf/itc/Ivie88

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@inproceedings{DBLP:conf/itc/Ivie88,
  author       = {John Ivie},
  title        = {A High Level Approach to Integrating Design and Test},
  booktitle    = {Proceedings International Test Conference 1988, Washington, D.C.,
                  USA, September 1988},
  pages        = {452--459},
  publisher    = {{IEEE} Computer Society},
  year         = {1988},
  url          = {https://doi.org/10.1109/TEST.1988.207756},
  doi          = {10.1109/TEST.1988.207756},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/Ivie88.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}