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BibTeX record conf/itc/InoueLW19
@inproceedings{DBLP:conf/itc/InoueLW19, author = {Michiko Inoue and Xiaowei Li and Cheng{-}Wen Wu}, title = {Asian Test Symposium - Past, Present and Future -}, booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC, USA, November 9-15, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ITC44170.2019.9000151}, doi = {10.1109/ITC44170.2019.9000151}, timestamp = {Sat, 30 Sep 2023 09:50:58 +0200}, biburl = {https://dblp.org/rec/conf/itc/InoueLW19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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