BibTeX record conf/itc/IkedaSLMXN19

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@inproceedings{DBLP:conf/itc/IkedaSLMXN19,
  author       = {Kosuke Ikeda and
                  Keith Schaub and
                  Ira Leventhal and
                  Yiorgos Makris and
                  Constantinos Xanthopoulos and
                  Deepika Neethirajan},
  title        = {Subtle Anomaly Detection of Microscopic Probes using Deep learning
                  based Image Completion},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
                  USA, November 9-15, 2019},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ITC44170.2019.9000126},
  doi          = {10.1109/ITC44170.2019.9000126},
  timestamp    = {Fri, 09 Apr 2021 18:35:25 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/IkedaSLMXN19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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