BibTeX record conf/itc/IbrahimK19

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@inproceedings{DBLP:conf/itc/IbrahimK19,
  author       = {Ahmed M. Y. Ibrahim and
                  Hans G. Kerkhoff},
  title        = {{DARS:} An {EDA} Framework for Reliability and Functional Safety Management
                  of System-on-Chips},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
                  USA, November 9-15, 2019},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ITC44170.2019.9000112},
  doi          = {10.1109/ITC44170.2019.9000112},
  timestamp    = {Sat, 19 Aug 2023 18:10:11 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/IbrahimK19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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