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BibTeX record conf/itc/HuangZWMYH22
@inproceedings{DBLP:conf/itc/HuangZWMYH22, author = {Junhua Huang and Hui{-}Ling Zhen and Naixing Wang and Hui Mao and Mingxuan Yuan and Yu Huang}, title = {Neural Fault Analysis for SAT-based {ATPG}}, booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA, September 23-30, 2022}, pages = {36--45}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/ITC50671.2022.00010}, doi = {10.1109/ITC50671.2022.00010}, timestamp = {Thu, 05 Jan 2023 13:25:50 +0100}, biburl = {https://dblp.org/rec/conf/itc/HuangZWMYH22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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