<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/itc/HuangRCRMTSZ02" mdate="2012-02-07">
<author>Yu Huang 0005</author>
<author>Sudhakar M. Reddy</author>
<author>Wu-Tung Cheng</author>
<author>Paul Reuter</author>
<author>Nilanjan Mukherjee</author>
<author>Chien-Chung Tsai</author>
<author>Omer Samman</author>
<author>Yahya Zaidan</author>
<title>Optimal Core Wrapper Width Selection and SOC Test Scheduling Based on 3-D Bin Packing Algorithm.</title>
<pages>74-82</pages>
<year>2002</year>
<crossref>conf/itc/2002</crossref>
<booktitle>ITC</booktitle>
<ee>http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041747</ee>
<url>db/conf/itc/itc2002.html#HuangRCRMTSZ02</url>
</inproceedings>
</dblp>
