BibTeX record conf/itc/HuNH020

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@inproceedings{DBLP:conf/itc/HuNH020,
  author       = {Hanbin Hu and
                  Nguyen Nguyen and
                  Chen He and
                  Peng Li},
  title        = {Advanced Outlier Detection Using Unsupervised Learning for Screening
                  Potential Customer Returns},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
                  USA, November 1-6, 2020},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC44778.2020.9325225},
  doi          = {10.1109/ITC44778.2020.9325225},
  timestamp    = {Sun, 02 Oct 2022 16:10:19 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/HuNH020.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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