BibTeX record conf/itc/HuH021

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@inproceedings{DBLP:conf/itc/HuH021,
  author       = {Hanbin Hu and
                  Chen He and
                  Peng Li},
  title        = {Semi-supervised Wafer Map Pattern Recognition using Domain-Specific
                  Data Augmentation and Contrastive Learning},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
                  October 10-15, 2021},
  pages        = {113--122},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ITC50571.2021.00019},
  doi          = {10.1109/ITC50571.2021.00019},
  timestamp    = {Sat, 09 Apr 2022 12:33:42 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/HuH021.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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