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BibTeX record conf/itc/HsiaoWLW22
@inproceedings{DBLP:conf/itc/HsiaoWLW22, author = {Sam M.{-}H. Hsiao and Lowry P.{-}T. Wang and Aaron C.{-}W. Liang and Charles H.{-}P. Wen}, title = {Existence of Single-Event Double-Node Upsets {(SEDU)} in Radiation-Hardened Latches for Sub-65nm {CMOS} Technologies}, booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA, September 23-30, 2022}, pages = {128--136}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/ITC50671.2022.00020}, doi = {10.1109/ITC50671.2022.00020}, timestamp = {Tue, 07 May 2024 20:06:45 +0200}, biburl = {https://dblp.org/rec/conf/itc/HsiaoWLW22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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