BibTeX record conf/itc/HsiaoWLW22

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@inproceedings{DBLP:conf/itc/HsiaoWLW22,
  author       = {Sam M.{-}H. Hsiao and
                  Lowry P.{-}T. Wang and
                  Aaron C.{-}W. Liang and
                  Charles H.{-}P. Wen},
  title        = {Existence of Single-Event Double-Node Upsets {(SEDU)} in Radiation-Hardened
                  Latches for Sub-65nm {CMOS} Technologies},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {128--136},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00020},
  doi          = {10.1109/ITC50671.2022.00020},
  timestamp    = {Tue, 07 May 2024 20:06:45 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/HsiaoWLW22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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