BibTeX record conf/itc/Hoye86

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@inproceedings{DBLP:conf/itc/Hoye86,
  author       = {Mary C. Murphy{-}Hoye},
  title        = {Artificial Intelligence in Semiconductor Manufacturing for Process
                  Development, Functional Diagnostics, and Yield Crash Prevention},
  booktitle    = {Proceedings International Test Conference 1986, Washington, D.C.,
                  USA, September 1986},
  pages        = {939--946},
  publisher    = {{IEEE} Computer Society},
  year         = {1986},
  timestamp    = {Wed, 25 Apr 2018 16:43:13 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/Hoye86.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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