BibTeX record conf/itc/HowellHBVDGRSFR18

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@inproceedings{DBLP:conf/itc/HowellHBVDGRSFR18,
  author       = {Will Howell and
                  Friedrich Hapke and
                  Edward Brazil and
                  Srikanth Venkataraman and
                  R. Datta and
                  Andreas Glowatz and
                  Wilfried Redemund and
                  J. Schmerberg and
                  Anja Fast and
                  Janusz Rajski},
  title        = {{DPPM} Reduction Methods and New Defect Oriented Test Methods Applied
                  to Advanced FinFET Technologies},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
                  October 29 - Nov. 1, 2018},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/TEST.2018.8624906},
  doi          = {10.1109/TEST.2018.8624906},
  timestamp    = {Mon, 01 Mar 2021 13:46:57 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HowellHBVDGRSFR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}