BibTeX record conf/itc/HouCLLKC16

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@inproceedings{DBLP:conf/itc/HouCLLKC16,
  author       = {Chih{-}Sheng Hou and
                  Yong{-}Xiao Chen and
                  Jin{-}Fu Li and
                  Chih{-}Yen Lo and
                  Ding{-}Ming Kwai and
                  Yung{-}Fa Chou},
  title        = {A built-in self-repair scheme for DRAMs with spare rows, columns,
                  and bits},
  booktitle    = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
                  TX, USA, November 15-17, 2016},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/TEST.2016.7805832},
  doi          = {10.1109/TEST.2016.7805832},
  timestamp    = {Tue, 17 Oct 2023 15:22:33 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/HouCLLKC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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