BibTeX record conf/itc/HongW97

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@inproceedings{DBLP:conf/itc/HongW97,
  author       = {Yeoh Eng Hong and
                  Martin Tay Tiong We},
  title        = {The Application of Novel Failure Analysis Techniques for Advanced
                  Multi-Layered {CMOS} Devices},
  booktitle    = {Proceedings {IEEE} International Test Conference 1997, Washington,
                  DC, USA, November 3-5, 1997},
  pages        = {304--309},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/TEST.1997.639631},
  doi          = {10.1109/TEST.1997.639631},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HongW97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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