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BibTeX record conf/itc/HoFVBG18
@inproceedings{DBLP:conf/itc/HoFVBG18, author = {Tien{-}Phu Ho and Eric Faehn and Arnaud Virazel and Alberto Bosio and Patrick Girard}, title = {An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs}, booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018}, pages = {1--8}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/TEST.2018.8624799}, doi = {10.1109/TEST.2018.8624799}, timestamp = {Tue, 21 Mar 2023 21:02:05 +0100}, biburl = {https://dblp.org/rec/conf/itc/HoFVBG18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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