BibTeX record conf/itc/HirabayashiSYKTKTO02

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@inproceedings{DBLP:conf/itc/HirabayashiSYKTKTO02,
  author       = {Osamu Hirabayashi and
                  Azuma Suzuki and
                  Tomoaki Yabe and
                  Atsushi Kawasumi and
                  Yasuhisa Takeyama and
                  Keiichi Kushida and
                  Akihito Tohata and
                  Nobuaki Otsuka},
  title        = {{DFT} Techniques for Wafer-Level At-Speed Testing of High-Speed SRAMs},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {164--169},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041757},
  doi          = {10.1109/TEST.2002.1041757},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HirabayashiSYKTKTO02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}