HigamiKOYTSAT09'

@inproceedings{DBLP:conf/itc/HigamiKOYTSAT09,
  author    = {Yoshinobu Higami and
               Yosuke Kurose and
               Satoshi Ohno and
               Hironori Yamaoka and
               Hiroshi Takahashi and
               Yoshihiro Shimizu and
               Takashi Aikyo and
               Yuzo Takamatsu},
  title     = {Diagnostic test generation for transition faults using a
               stuck-at ATPG tool},
  booktitle = {ITC},
  year      = {2009},
  pages     = {1-9},
  ee        = {http://dx.doi.org/10.1109/TEST.2009.5355681},
  crossref  = {DBLP:conf/itc/2009},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2009,
  editor    = {Gordon W. Roberts and
               Bill Eklow},
  title     = {2009 IEEE International Test Conference, ITC 2009, Austin,
               TX, USA, November 1-6, 2009},
  booktitle = {ITC},
  publisher = {IEEE},
  year      = {2009},
  isbn      = {978-1-4244-4868-5},
  ee        = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5348788},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}