default search action
BibTeX record conf/itc/HendersonWH92
@inproceedings{DBLP:conf/itc/HendersonWH92, author = {Christopher L. Henderson and Richard H. Williams and Charles F. Hawkins}, title = {Economic Impact of Type {I} Test Errors at System and Board Levels}, booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992}, pages = {444--452}, publisher = {{IEEE} Computer Society}, year = {1992}, url = {https://doi.org/10.1109/TEST.1992.527855}, doi = {10.1109/TEST.1992.527855}, timestamp = {Thu, 23 Mar 2023 23:58:41 +0100}, biburl = {https://dblp.org/rec/conf/itc/HendersonWH92.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.