BibTeX record conf/itc/HelmreichNWM91

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@inproceedings{DBLP:conf/itc/HelmreichNWM91,
  author       = {Klaus Helmreich and
                  Peter Nagel and
                  Werner Wolz and
                  Klaus D. M{\"{u}}ller{-}Glaser},
  title        = {An Approach to Chip-Internal Current Monitoring and Measurement Using
                  an Electron Beam Tester},
  booktitle    = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
                  Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  pages        = {256--262},
  publisher    = {{IEEE} Computer Society},
  year         = {1991},
  url          = {https://doi.org/10.1109/TEST.1991.519517},
  doi          = {10.1109/TEST.1991.519517},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/HelmreichNWM91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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