BibTeX record conf/itc/HeGAWFKRPRSL22

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@inproceedings{DBLP:conf/itc/HeGAWFKRPRSL22,
  author       = {Chen He and
                  Paul Grosch and
                  Onder Anilturk and
                  Joyce Witowski and
                  Carl Ford and
                  Rahul Kalyan and
                  John C. Robinson and
                  David W. Price and
                  Jay Rathert and
                  Barry Saville and
                  Dave Lee},
  title        = {Defect-Directed Stress Testing Based on Inline Inspection Results},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {427--435},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00050},
  doi          = {10.1109/ITC50671.2022.00050},
  timestamp    = {Thu, 05 Jan 2023 13:25:50 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HeGAWFKRPRSL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}