BibTeX record conf/itc/He19

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@inproceedings{DBLP:conf/itc/He19,
  author       = {Chen He},
  title        = {Advanced Burn-In - An Optimized Product Stress and Test Flow for Automotive
                  Microcontrollers},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
                  USA, November 9-15, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ITC44170.2019.9000147},
  doi          = {10.1109/ITC44170.2019.9000147},
  timestamp    = {Sun, 02 Oct 2022 16:10:19 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/He19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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