Kazumi Hatayama Michinobu Nakao Yoshikazu Kiyoshige Koichiro Natsume Yasuo Sato Takaharu Nagumo Application of High-Quality Built-In Test to Industrial Designs. 1003-1012 2002 conf/itc/2002 ITC http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75431003abs.htm db/conf/itc/itc2002.html#HatayamaNKNSN02