DBLP Record 'conf/itc/HatayamaNKNSN02'

BibTeX

@inproceedings{DBLP:conf/itc/HatayamaNKNSN02,
  author    = {Kazumi Hatayama and
               Michinobu Nakao and
               Yoshikazu Kiyoshige and
               Koichiro Natsume and
               Yasuo Sato and
               Takaharu Nagumo},
  title     = {Application of High-Quality Built-In Test to Industrial
               Designs},
  booktitle = {ITC},
  year      = {2002},
  pages     = {1003-1012},
  ee        = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75431003abs.htm},
  crossref  = {DBLP:conf/itc/2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2002,
  title     = {Proceedings IEEE International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  publisher = {IEEE Computer Society},
  year      = {2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}