BibTeX record conf/itc/HatayamaNKNSN02

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@inproceedings{DBLP:conf/itc/HatayamaNKNSN02,
  author       = {Kazumi Hatayama and
                  Michinobu Nakao and
                  Yoshikazu Kiyoshige and
                  Koichiro Natsume and
                  Yasuo Sato and
                  Takaharu Nagumo},
  title        = {Application of High-Quality Built-In Test to Industrial Designs},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {1003--1012},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041856},
  doi          = {10.1109/TEST.2002.1041856},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HatayamaNKNSN02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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