BibTeX record conf/itc/HapkeRSKGWHE10

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@inproceedings{DBLP:conf/itc/HapkeRSKGWHE10,
  author       = {Friedrich Hapke and
                  Wilfried Redemund and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Rene Krenz{-}Baath and
                  Andreas Glowatz and
                  Michael Wittke and
                  Hamidreza Hashempour and
                  Stefan Eichenberger},
  editor       = {Ron Press and
                  Erik H. Volkerink},
  title        = {Defect-oriented cell-internal testing},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
                  USA, November 2-4, 2010},
  pages        = {285--294},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/TEST.2010.5699229},
  doi          = {10.1109/TEST.2010.5699229},
  timestamp    = {Thu, 23 Mar 2023 23:58:37 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HapkeRSKGWHE10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}