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BibTeX record conf/itc/Gupta18
@inproceedings{DBLP:conf/itc/Gupta18, author = {Pallav Gupta}, title = {An Effective Methodology for Automated Diagnosis of Functional Pattern Failures to Support Silicon Debug}, booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018}, pages = {1--8}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/TEST.2018.8624881}, doi = {10.1109/TEST.2018.8624881}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/itc/Gupta18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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