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DBLP Record 'conf/itc/GoncalvesSTT98'

BibTeX

@inproceedings{DBLP:conf/itc/GoncalvesSTT98,
  author    = {Fernando M. Gon\c{c}alves and
               Marcelino B. Santos and
               Isabel C. Teixeira and
               Jo{\~a}o Paulo Teixeira},
  title     = {Defect-oriented test quality assessment using fault sampling
               and simulation},
  booktitle = {ITC},
  year      = {1998},
  pages     = {35-42},
  ee        = {http://www.computer.org/proceedings/itc/5093/50930035abs.htm},
  crossref  = {DBLP:conf/itc/1998},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1998,
  title     = {Proceedings IEEE International Test Conference 1998, Washington,
               DC, USA, October 18-22, 1998},
  publisher = {IEEE Computer Society},
  year      = {1998},
  isbn      = {0-7803-5093-6},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2005-06-09 by Michael Ley (ley@uni-trier.de)