BibTeX
@inproceedings{DBLP:conf/itc/GoncalvesSTT98,
author = {Fernando M. Gon\c{c}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~a}o Paulo Teixeira},
title = {Defect-oriented test quality assessment using fault sampling
and simulation},
booktitle = {ITC},
year = {1998},
pages = {35-42},
ee = {http://www.computer.org/proceedings/itc/5093/50930035abs.htm},
crossref = {DBLP:conf/itc/1998},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1998,
title = {Proceedings IEEE International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
year = {1998},
isbn = {0-7803-5093-6},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2005-06-09 by Michael Ley (ley@uni-trier.de)