BibTeX record conf/itc/GoelAWCHMLCKVMSCLCK13

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@inproceedings{DBLP:conf/itc/GoelAWCHMLCKVMSCLCK13,
  author       = {Sandeep Kumar Goel and
                  Saman Adham and
                  Min{-}Jer Wang and
                  Ji{-}Jan Chen and
                  Tze{-}Chiang Huang and
                  Ashok Mehta and
                  Frank Lee and
                  Vivek Chickermane and
                  Brion L. Keller and
                  Thomas Valind and
                  Subhasish Mukherjee and
                  Navdeep Sood and
                  Jeongho Cho and
                  Hayden Hyungdong Lee and
                  Jungi Choi and
                  Sangdoo Kim},
  title        = {Test and debug strategy for {TSMC} CoWoS{\texttrademark} stacking
                  process based heterogeneous 3D {IC:} {A} silicon case study},
  booktitle    = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
                  USA, September 6-13, 2013},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/TEST.2013.6651893},
  doi          = {10.1109/TEST.2013.6651893},
  timestamp    = {Thu, 23 Mar 2023 23:58:37 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/GoelAWCHMLCKVMSCLCK13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}