BibTeX record conf/itc/Gessner07

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@inproceedings{DBLP:conf/itc/Gessner07,
  author       = {Bernd Gessner},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {How to ensure zero defects from the beginning with semiconductor test
                  methods},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--2},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437697},
  doi          = {10.1109/TEST.2007.4437697},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/Gessner07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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