GermidaYPM99'

BibTeX

@inproceedings{DBLP:conf/itc/GermidaYPM99,
  author    = {Amy Germida and
               Zheng Yan and
               James F. Plusquellic and
               Fidel Muradali},
  title     = {Defect detection using power supply transient signal analysis},
  booktitle = {ITC},
  year      = {1999},
  pages     = {67-76},
  crossref  = {DBLP:conf/itc/1999},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1999,
  title     = {Proceedings IEEE International Test Conference 1999, Atlantic
               City, NJ, USA, 27-30 September 1999},
  publisher = {IEEE Computer Society},
  year      = {1999},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}