<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/itc/GeigerB09" mdate="2012-02-06">
<author>Philip B. Geiger</author>
<author>Steve Butkovich</author>
<title>Boundary-scan adoption - an industry snapshot with emphasis on the semiconductor industry.</title>
<pages>1-10</pages>
<year>2009</year>
<booktitle>ITC</booktitle>
<ee>http://dx.doi.org/10.1109/TEST.2009.5355673</ee>
<crossref>conf/itc/2009</crossref>
<url>db/conf/itc/itc2009.html#GeigerB09</url>
</inproceedings>
</dblp>
