BibTeX record conf/itc/GartnerDFFKLORRW90

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@inproceedings{DBLP:conf/itc/GartnerDFFKLORRW90,
  author       = {J. Gartner and
                  B. Driscoll and
                  Donato O. Forlenza and
                  Orazio P. Forlenza and
                  Timothy J. Koprowski and
                  T. Lizambri and
                  R. Olsen and
                  S. Robertson and
                  P. Ryan and
                  A. Walter},
  title        = {Weighted random test program generation for a per-pin tester},
  booktitle    = {Proceedings {IEEE} International Test Conference 1990, Washington,
                  D.C., USA, September 10-14, 1990},
  pages        = {1000--1005},
  publisher    = {{IEEE} Computer Society},
  year         = {1990},
  url          = {https://doi.org/10.1109/TEST.1990.114122},
  doi          = {10.1109/TEST.1990.114122},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/GartnerDFFKLORRW90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}