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BibTeX record conf/itc/GaoMHSBHCGM19
@inproceedings{DBLP:conf/itc/GaoMHSBHCGM19, author = {Zhan Gao and Santosh Malagi and Min{-}Chun Hu and Joe Swenton and Rogier Baert and Jos Huisken and Bilal Chehab and Kees Goossens and Erik Jan Marinissen}, title = {Application of Cell-Aware Test on an Advanced 3nm {CMOS} Technology Library}, booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC, USA, November 9-15, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ITC44170.2019.9000164}, doi = {10.1109/ITC44170.2019.9000164}, timestamp = {Mon, 05 Feb 2024 20:31:30 +0100}, biburl = {https://dblp.org/rec/conf/itc/GaoMHSBHCGM19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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