BibTeX record conf/itc/GaoMHSBHCGM19

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@inproceedings{DBLP:conf/itc/GaoMHSBHCGM19,
  author       = {Zhan Gao and
                  Santosh Malagi and
                  Min{-}Chun Hu and
                  Joe Swenton and
                  Rogier Baert and
                  Jos Huisken and
                  Bilal Chehab and
                  Kees Goossens and
                  Erik Jan Marinissen},
  title        = {Application of Cell-Aware Test on an Advanced 3nm {CMOS} Technology
                  Library},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
                  USA, November 9-15, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ITC44170.2019.9000164},
  doi          = {10.1109/ITC44170.2019.9000164},
  timestamp    = {Mon, 05 Feb 2024 20:31:30 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/GaoMHSBHCGM19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}