FujiwaraY92'

@inproceedings{DBLP:conf/itc/FujiwaraY92,
  author    = {Hideo Fujiwara and
               Akihiro Yamamoto},
  title     = {Parity-Scan Design to Reduce the Cost of Test Application},
  booktitle = {ITC},
  year      = {1992},
  pages     = {283-292},
  ee        = {http://dx.doi.org/10.1109/TEST.1992.527835},
  crossref  = {DBLP:conf/itc/1992},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1992,
  title     = {Proceedings IEEE International Test Conference 1992, Discover
               the New World of Test and Design, Baltimore, Maryland, USA,
               September 20-24, 1992},
  booktitle = {ITC},
  publisher = {IEEE Computer Society},
  year      = {1992},
  isbn      = {0-7803-0760-7},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}