FranchRNHFDWGS07'

@inproceedings{DBLP:conf/itc/FranchRNHFDWGS07,
  author    = {Robert L. Franch and
               Phillip Restle and
               James K. Norman and
               William V. Huott and
               Joshua Friedrich and
               R. Dixon and
               Steve Weitzel and
               K. van Goor and
               G. Salem},
  title     = {On-chip timing uncertainty measurements on IBM microprocessors},
  booktitle = {ITC},
  year      = {2007},
  pages     = {1-7},
  ee        = {http://dx.doi.org/10.1109/TEST.2007.4437560},
  crossref  = {DBLP:conf/itc/2007},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2007,
  editor    = {Jill Sibert and
               Janusz Rajski},
  title     = {2007 IEEE International Test Conference, ITC 2007, Santa
               Clara, California, USA, October 21-26, 2007},
  booktitle = {ITC},
  publisher = {IEEE},
  year      = {2007},
  isbn      = {1-4244-1128-9},
  ee        = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4437545},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}