Thomas G. Foote Dale E. Hoffman William V. Huott Timothy J. Koprowski Bryan J. Robbins Mary P. Kusko Testing the 400-MHz IBM Generation-4 CMOS Chip. 106-114 1997 conf/itc/1997 ITC db/conf/itc/itc1997.html#FooteHHKRK97 http://doi.ieeecomputersociety.org/10.1109/TEST.1997.639601