@inproceedings{DBLP:conf/itc/FarrenA94,
author = {Des Farren and
Anthony P. Ambler},
title = {System Test Cost Modelling Based on Event Rate Analysis},
booktitle = {ITC},
year = {1994},
pages = {84-92},
ee = {http://dx.doi.org/10.1109/TEST.1994.527939},
crossref = {DBLP:conf/itc/1994},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1994,
title = {Proceedings IEEE International Test Conference 1994, TEST:
The Next 25 Years, Washington, DC, USA, October 2-6, 1994},
publisher = {IEEE Computer Society},
year = {1994},
isbn = {0-7803-2103-0},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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