BibTeX record conf/itc/DeutschC15a

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@inproceedings{DBLP:conf/itc/DeutschC15a,
  author       = {Sergej Deutsch and
                  Krishnendu Chakrabarty},
  title        = {Test and debug solutions for 3D-stacked integrated circuits},
  booktitle    = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
                  USA, October 6-8, 2015},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/TEST.2015.7342421},
  doi          = {10.1109/TEST.2015.7342421},
  timestamp    = {Mon, 03 Jan 2022 22:13:40 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DeutschC15a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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