DesineniPB06'

@inproceedings{DBLP:conf/itc/DesineniPB06,
  author    = {Rao Desineni and
               Osei Poku and
               Ronald D. Blanton},
  title     = {A Logic Diagnosis Methodology for Improved Localization
               and Extraction of Accurate Defect Behavior},
  booktitle = {ITC},
  year      = {2006},
  pages     = {1-10},
  ee        = {http://dx.doi.org/10.1109/TEST.2006.297627},
  crossref  = {DBLP:conf/itc/2006},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2006,
  editor    = {Scott Davidson and
               Anne Gattiker},
  title     = {2006 IEEE International Test Conference, ITC 2006, Santa
               Clara, CA, USA, October 22-27, 2006},
  booktitle = {ITC},
  publisher = {IEEE},
  year      = {2006},
  isbn      = {1-4244-0292-1},
  ee        = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4079296},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}