BibTeX record conf/itc/DayGRZ98

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@inproceedings{DBLP:conf/itc/DayGRZ98,
  author       = {Leland L. Day and
                  Paul A. Ganfield and
                  Dennis M. Rickert and
                  Fred J. Ziegler},
  title        = {Test methodology for a microprocessor with partial scan},
  booktitle    = {Proceedings {IEEE} International Test Conference 1998, Washington,
                  DC, USA, October 18-22, 1998},
  pages        = {708--716},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/TEST.1998.743215},
  doi          = {10.1109/TEST.1998.743215},
  timestamp    = {Thu, 23 Mar 2023 23:58:37 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DayGRZ98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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