BibTeX record conf/itc/DavisKLB03

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@inproceedings{DBLP:conf/itc/DavisKLB03,
  author       = {John S. Davis and
                  David C. Keezer and
                  Odile Liboiron{-}Ladouceur and
                  Keren Bergman},
  title        = {Application and Demonstration of a Digital Test Core: Optoelectronic
                  Test Bed and Wafer-level Prober},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {166--174},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1270837},
  doi          = {10.1109/TEST.2003.1270837},
  timestamp    = {Wed, 11 Oct 2023 14:24:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/DavisKLB03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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