Tri-Scan: A Novel DFT Technique for CMOS Path Delay Fault Testing.

Ramyanshu Datta Ravi Gupta Antony Sebastine Jacob A. Abraham Manuel A. d'Abreu Tri-Scan: A Novel DFT Technique for CMOS Path Delay Fault Testing. 1118-1127 2004 conf/itc/2004 ITC http://doi.ieeecomputersociety.org/10.1109/ITC.2004.197 db/conf/itc/itc2004.html#DattaGSAd04