BibTeX record: conf/itc/DaltonADSCKS86

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@inproceedings{DBLP:conf/itc/DaltonADSCKS86,
  author    = {Earl Dalton and
               Walter Ahern and
               Stephen Denker and
               Ken Sweitzer and
               Bill Cooper and
               Tom Kelly and
               Stan Smith},
  title     = {Systematic Yield Improvement in Board Testing Practice},
  booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
               USA, September 1986},
  pages     = {80--83},
  year      = {1986},
  crossref  = {DBLP:conf/itc/1986},
  timestamp = {Tue, 22 Oct 2002 12:22:37 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/DaltonADSCKS86},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/1986,
  title     = {Proceedings International Test Conference 1986, Washington, D.C.,
               USA, September 1986},
  publisher = {{IEEE} Computer Society},
  year      = {1986},
  timestamp = {Tue, 22 Oct 2002 12:22:37 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/1986},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}