DBLP Record 'conf/itc/DaaschMBC00'

BibTeX

@inproceedings{DBLP:conf/itc/DaaschMBC00,
  author    = {W. Robert Daasch and
               James McNames and
               Daniel Bockelman and
               Kevin Cota},
  title     = {Variance reduction using wafer patterns in I_ddQ data},
  booktitle = {ITC},
  year      = {2000},
  pages     = {189-198},
  crossref  = {DBLP:conf/itc/2000},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2000,
  title     = {Proceedings IEEE International Test Conference 2000, Atlantic
               City, NJ, USA, October 2000},
  publisher = {IEEE Computer Society},
  year      = {2000},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}