BibTeX record conf/itc/CuseyP97

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@inproceedings{DBLP:conf/itc/CuseyP97,
  author       = {James P. Cusey and
                  Janak H. Patel},
  title        = {{BART:} {A} Bridging Fault Test Generation for Sequential Circuits},
  booktitle    = {Proceedings {IEEE} International Test Conference 1997, Washington,
                  DC, USA, November 3-5, 1997},
  pages        = {838--847},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/TEST.1997.639698},
  doi          = {10.1109/TEST.1997.639698},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/CuseyP97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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