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BibTeX record conf/itc/ColeSTCBBHH97
@inproceedings{DBLP:conf/itc/ColeSTCBBHH97, author = {Edward I. Cole Jr. and Jerry M. Soden and Paiboon Tangyunyong and Patrick L. Candelaria and Richard W. Beegle and Daniel L. Barton and Christopher L. Henderson and Charles F. Hawkins}, title = {Transient Power Supply Voltage (V\({}_{\mbox{DDT}}\)) Analysis for Detecting {IC} Defects}, booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington, DC, USA, November 3-5, 1997}, pages = {23--31}, publisher = {{IEEE} Computer Society}, year = {1997}, url = {https://doi.org/10.1109/TEST.1997.639590}, doi = {10.1109/TEST.1997.639590}, timestamp = {Thu, 23 Mar 2023 23:58:41 +0100}, biburl = {https://dblp.org/rec/conf/itc/ColeSTCBBHH97.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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