BibTeX record conf/itc/ColeSTCBBHH97

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@inproceedings{DBLP:conf/itc/ColeSTCBBHH97,
  author       = {Edward I. Cole Jr. and
                  Jerry M. Soden and
                  Paiboon Tangyunyong and
                  Patrick L. Candelaria and
                  Richard W. Beegle and
                  Daniel L. Barton and
                  Christopher L. Henderson and
                  Charles F. Hawkins},
  title        = {Transient Power Supply Voltage (V\({}_{\mbox{DDT}}\)) Analysis for
                  Detecting {IC} Defects},
  booktitle    = {Proceedings {IEEE} International Test Conference 1997, Washington,
                  DC, USA, November 3-5, 1997},
  pages        = {23--31},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/TEST.1997.639590},
  doi          = {10.1109/TEST.1997.639590},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ColeSTCBBHH97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}