BibTeX record conf/itc/ChungG10

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@inproceedings{DBLP:conf/itc/ChungG10,
  author       = {Kun Young Chung and
                  Sandeep K. Gupta},
  editor       = {Ron Press and
                  Erik H. Volkerink},
  title        = {Design and test of latch-based circuits to maximize performance, yield,
                  and delay test quality},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
                  USA, November 2-4, 2010},
  pages        = {94--103},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/TEST.2010.5699209},
  doi          = {10.1109/TEST.2010.5699209},
  timestamp    = {Fri, 22 Sep 2023 10:12:26 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/ChungG10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}