BibTeX record conf/itc/ChiuYHW02

download as .bib file

@inproceedings{DBLP:conf/itc/ChiuYHW02,
  author       = {Sau{-}Kwo Chiu and
                  Jen{-}Chieh Yeh and
                  Chih{-}Tsun Huang and
                  Cheng{-}Wen Wu},
  title        = {Diagonal Test and Diagnostic Schemes for Flash Memorie},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {37--46},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041743},
  doi          = {10.1109/TEST.2002.1041743},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ChiuYHW02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.