DBLP Record 'conf/itc/ChiuYHW02'

BibTeX

@inproceedings{DBLP:conf/itc/ChiuYHW02,
  author    = {Sau-Kwo Chiu and
               Jen-Chieh Yeh and
               Chih-Tsun Huang and
               Cheng-Wen Wu},
  title     = {Diagonal Test and Diagnostic Schemes for Flash Memorie},
  booktitle = {ITC},
  year      = {2002},
  pages     = {37-46},
  ee        = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430037abs.htm},
  crossref  = {DBLP:conf/itc/2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2002,
  title     = {Proceedings IEEE International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  publisher = {IEEE Computer Society},
  year      = {2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}