BibTeX record: conf/itc/ChenWCRT10

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@inproceedings{DBLP:conf/itc/ChenWCRT10,
  author    = {Tsung{-}Tang Chen and
               Po{-}Han Wu and
               Kung{-}Han Chen and
               Jiann{-}Chyi Rau and
               Shih{-}Ming Tzeng},
  title     = {The AB-filling methodology for power-aware at-speed scan testing},
  booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
               USA, November 2-4, 2010},
  year      = {2010},
  pages     = {807},
  crossref  = {DBLP:conf/itc/2010},
  url       = {http://dx.doi.org/10.1109/TEST.2010.5699299},
  doi       = {10.1109/TEST.2010.5699299},
  timestamp = {Wed, 22 Oct 2014 18:04:54 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/ChenWCRT10},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/2010,
  editor    = {Ron Press and
               Erik H. Volkerink},
  title     = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
               USA, November 2-4, 2010},
  year      = {2010},
  publisher = {{IEEE}},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5684496},
  isbn      = {978-1-4244-7206-2},
  timestamp = {Wed, 22 Oct 2014 18:04:54 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/2010},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}