DBLP BibTeX Record 'conf/itc/ChenWCRT10'

@inproceedings{DBLP:conf/itc/ChenWCRT10,
  author    = {Tsung-Tang Chen and
               Po-Han Wu and
               Kung-Han Chen and
               Jiann-Chyi Rau and
               Shih-Ming Tzeng},
  title     = {The AB-filling methodology for power-aware at-speed scan
               testing},
  booktitle = {ITC},
  year      = {2010},
  pages     = {807},
  ee        = {http://dx.doi.org/10.1109/TEST.2010.5699299},
  crossref  = {DBLP:conf/itc/2010},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/2010,
  editor    = {Ron Press and
               Erik H. Volkerink},
  title     = {2011 IEEE International Test Conference, ITC 2010, Austin,
               TX, USA, November 2-4, 2010},
  booktitle = {ITC},
  publisher = {IEEE},
  year      = {2010},
  isbn      = {978-1-4244-7206-2},
  ee        = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5684496},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}