BibTeX record conf/itc/ChenLCW19

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@inproceedings{DBLP:conf/itc/ChenLCW19,
  author       = {Hao Chen and
                  Mincent Lee and
                  Liang{-}Yen Chen and
                  Min{-}Jer Wang},
  title        = {High Quality Test Methodology for Highly Reliable Devices},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
                  USA, November 9-15, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ITC44170.2019.9000174},
  doi          = {10.1109/ITC44170.2019.9000174},
  timestamp    = {Wed, 26 May 2021 16:52:01 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/ChenLCW19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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