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BibTeX record conf/itc/ChenKWSRM01
@inproceedings{DBLP:conf/itc/ChenKWSRM01, author = {John T. Chen and Jitendra Khare and Ken Walker and Saghir A. Shaikh and Janusz Rajski and Wojciech Maly}, title = {Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring}, booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001}, pages = {258--267}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/TEST.2001.966641}, doi = {10.1109/TEST.2001.966641}, timestamp = {Thu, 23 Mar 2023 23:58:42 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChenKWSRM01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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