DBLP Record 'conf/itc/ChenKWSRM01'

BibTeX

@inproceedings{DBLP:conf/itc/ChenKWSRM01,
  author    = {John T. Chen and
               Jitendra Khare and
               Ken Walker and
               Saghir A. Shaikh and
               Janusz Rajski and
               Wojciech Maly},
  title     = {Test response compression and bitmap encoding for embedded
               memories in manufacturing process monitoring},
  booktitle = {ITC},
  year      = {2001},
  pages     = {258-267},
  crossref  = {DBLP:conf/itc/2001},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2001,
  title     = {Proceedings IEEE International Test Conference 2001, Baltimore,
               MD, USA, 30 October - 1 November 2001},
  publisher = {IEEE Computer Society},
  year      = {2001},
  isbn      = {0-7803-7169-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}